Part 1 introduces the historical basis for power measurements, and provides definitions for average, peak, and complex modulations. This application note overviews various sensor technologies needed for the diversity of test signals. It describes the hierarchy of international power traceability, yielding comparison to national standards at worldwide national measurement institutes (NMIs) like the U.S. National Institute of Standards and Technology.

Part 3 discusses the all-important theory and practice of expressing measurement uncertainty, mismatch considerations, signal flowgraphs, ISO 17025, and examples of typical calculations. Considerable detail is shown on
the ISO 17025, Guide for the Expression of Measurement Uncertainties, has become the international standard for determining operating specifications. Agilent has transitioned from ANSI/NCSL Z540-1-1994 to ISO 17025.

Provides a useful EVM troubleshooting decision tree.

Error vector magnitude (EVM) measurements can provide a great deal of insight into the performance of digitally modulated signals. With proper use, EVM and related measurements can pinpoint exactly the type of degradations present in a signal and can even help identify their sources. This note reviews the basics of EVM measurements on the Agilent Technologies 89400 vector signal analyzers, and outlines a general procedure that may be used to methodically track down even the most obscure signal problems.

Although this video is from 1959, it still provides and excellent explanation of wave properties and reflections.

This application note from Agilent describes the challenges of measuring distortion products from your device under test. The challenges arise from the need to measure weak distortion product and harmonic signals in the presence of strong carrier signals, combined with the fact that the analog components in the test instrumentation produce their own unwanted distortion signals.