Covers resolution bandwidth, cable losses, low level signals, dynamic range, internal distortion products, optimizing speed for transients, selecting display detectors, and time gating.
From Agilent (AN-1286-1)

Description of y factor and cold source noise figure techniques. Includes a glossary and comprehensive description of test equipment.

Advances in software, microprocessors and display technology have expanded the capabilities of modern function generators. The latest models can produce a variety of signals, including common waveforms, arbitrary waveforms and sophisticated modulated waveforms. Many use direct digital synthesis (DDS), which creates a stable, accurate output for clean, low-distortion sine waves. DDS also enables square waves with fast rise and fall times. The added capability gives you more fl exibility for testing your devices.