Keysight RF Test Blog

Author: 

Ben Zarlingo

This blog explores various topics in RF test and measurement, from the latest equipment to best practice techniques to ensure consistent results and understand uncertainty limitations.

My name is Ben Zarlingo and I'm an applications specialist for Keysight Technologies. I've been an electrical engineer working in test & measurement for several decades now, mostly in signal analysis. For the past 20 years I've been involved primarily in wireless and other RF testing.

RF engineers know that making good measurements is a challenge, and I hope this blog will contribute something to our common efforts to find the best solutions. I work at the interface between Keysight’s R&D engineers and those who make real-world measurements, so I encounter lots of the issues that RF engineers face. Fortunately I also encounter lots of information, equipment, and measurement techniques that improve accuracy, measurement speed, dynamic range, sensitivity, repeatability, etc.

In this blog I’ll share what I know and learn, and I invite you to do the same in the comments. Together we’ll find ways to make better RF measurements no matter what “better” means to you.

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